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 Freescale Semiconductor, Inc.
DSP56F801/D Rev. 13.0, 02/2004
56F801
Technical Data
56F801 16-bit Hybrid Controller
* * Up to 30 MIPS operation at 60MHz core frequency Up to 40 MIPS operation at 80MHz core frequency DSP and MCU functionality in a unified, C-efficient architecture MCU-friendly instruction set supports both DSP and controller functions: MAC, bit manipulation unit, 14 addressing modes Hardware DO and REP loops 6-channel PWM Module Two 4-channel, 12-bit ADCs Serial Communications Interface (SCI)
6 PWM Outputs
* * * * * * * * * * *
8K x 16-bit words Program Flash 1K x 16-bit words Program RAM 2K x 16-bit words Data Flash 1K x 16-bit words Data RAM 2K x 16-bit words Boot Flash Serial Peripheral Interface (SPI) General Purpose Quad Timer JTAG/OnCETM port for debugging On-chip relaxation oscillator 11 shared GPIO 48-pin LQFP Package
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* *
* * * *
PWMA
RESET IRQA 6 JTAG/ OnCE Port VCAPC VDD 2 4 VSS 5* Digital Reg Analog Reg VDDA VSSA
Fault Input
4 4
A/D1 A/D2 VREF
ADC Interrupt Controller
Low Voltage Supervisor
Program Controller and Hardware Looping Unit
Address Generation Unit
Data ALU 16 x 16 + 36 36-Bit MAC Three 16-bit Input Registers Two 36-bit Accumulators
Bit Manipulation Unit
Quad Timer C Quad Timer D or GPIO
Program Memory 8188 x 16 Flash 1024 x 16 SRAM Boot Flash 2048 x 16 Flash Data Memory 2048 x 16 Flash 1024 x 16 SRAM
*
PAB
* *
PDB
* * * *
IPBB CONTROLS 16
PLL
3
XDB2 CGDB XAB1 XAB2
16-Bit 56800 Core
Clock Gen or Optional Internal Relaxation Osc.
GPIOB3/XTAL GPIOB2/EXTAL
*
2
SCI0 or GPIO
INTERRUPT CONTROLS 16 COP/ Watchdog COP RESET MODULE CONTROLS ADDRESS BUS [8:0] DATA BUS [15:0]
4
SPI or GPIO
ApplicationSpecific Memory & Peripherals
IPBus Bridge (IPBB)
*includes TCS pin which is reserved for factory use and is tied to VSS
Figure 1. 56F801 Block Diagram
(c) Motorola, Inc., 2004. All rights reserved.
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Part 1 Overview
1.1 56F801 Features
1.1.1
* * * * * * * * * * * * * *
Digital Signal Processing Core
Efficient 16-bit 56800 family hybrid controller engine with dual Harvard architecture As many as 40 Million Instructions Per Second (MIPS) at 80MHz core frequency Single-cycle 16 x 16-bit parallel Multiplier-Accumulator (MAC) Two 36-bit accumulators including extension bits 16-bit bidirectional barrel shifter Parallel instruction set with unique DSP addressing modes Hardware DO and REP loops Three internal address buses and one external address bus Four internal data buses and one external data bus Instruction set supports both DSP and controller functions Controller style addressing modes and instructions for compact code Efficient C compiler and local variable support Software subroutine and interrupt stack with depth limited only by memory JTAG/OnCE debug programming interface
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1.1.2
* *
Memory
Harvard architecture permits as many as three simultaneous accesses to Program and Data memory On-chip memory including a low-cost, high-volume Flash solution -- 8K x 16 bit words of Program Flash -- 1K x 16-bit words of Program RAM -- 2K x 16-bit words of Data Flash -- 1K x 16-bit words of Data RAM -- 2K x 16-bit words of Boot Flash
*
Programmable Boot Flash supports customized boot code and field upgrades of stored code through a variety of interfaces (JTAG, SPI)
1.1.3
* * * * *
2
Peripheral Circuits for 56F801
Pulse Width Modulator (PWM) with six PWM outputs, two Fault inputs, fault-tolerant design with deadtime insertion; supports both center- and edge-aligned modes Two 12-bit, Analog-to-Digital Converters (ADCs), which support two simultaneous conversions with two 4-multiplexed inputs; ADC and PWM modules can be synchronized General Purpose Quad Timer: Timer D with three pins (or three additional GPIO lines) Serial Communication Interface (SCI) with two pins (or two additional GPIO lines) Serial Peripheral Interface (SPI) with configurable four-pin port (or four additional GPIO lines)
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56F801 Description
* * * * * * *
Eleven multiplexed General Purpose I/O (GPIO) pins Computer-Operating Properly (COP) watchdog timer One dedicated external interrupt pin External reset pin for hardware reset JTAG/On-Chip Emulation (OnCETM) for unobtrusive, processor speed-independent debugging Software-programmable, Phase Locked Loop-based frequency synthesizer for the hybrid controller core clock Oscillator flexibility between either an external crystal oscillator or an on-chip relaxation oscillator for lower system cost and two additional GPIO lines
1.1.4
Energy Information
Fabricated in high-density CMOS with 5V-tolerant, TTL-compatible digital inputs Uses a single 3.3V power supply On-chip regulators for digital and analog circuitry to lower cost and reduce noise Wait and Stop modes available
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* * * *
1.2 56F801 Description
The 56F801 is a member of the 56800 core-based family of hybrid controllers. It combines, on a single chip, the processing power of a DSP and the functionality of a microcontroller with a flexible set of peripherals to create an extremely cost-effective solution. Because of its low cost, configuration flexibility, and compact program code, the 56F801 is well-suited for many applications. The 56F801 includes many peripherals that are especially useful for applications such as motion control, smart appliances, steppers, encoders, tachometers, limit switches, power supply and control, automotive control, engine management, noise suppression, remote utility metering, and industrial control for power, lighting, and automation. The 56800 core is based on a Harvard-style architecture consisting of three execution units operating in parallel, allowing as many as six operations per instruction cycle. The microprocessor-style programming model and optimized instruction set allow straightforward generation of efficient, compact code for both DSP and MCU applications. The instruction set is also highly efficient for C compilers to enable rapid development of optimized control applications. The 56F801 supports program execution from either internal or external memories. Two data operands can be accessed from the on-chip Data RAM per instruction cycle. The 56F801 also provides one external dedicated interrupt lines and up to 11 General Purpose Input/Output (GPIO) lines, depending on peripheral configuration. The 56F801 controller includes 8K words (16-bit) of Program Flash and 2K words of Data Flash (each programmable through the JTAG port) with 1K words of both Program and Data RAM. A total of 2K words of Boot Flash is incorporated for easy customer-inclusion of field-programmable software routines that can be used to program the main Program and Data Flash memory areas. Both Program and Data Flash memories can be independently bulk erased or erased in page sizes of 256 words. The Boot Flash memory can also be either bulk or page erased. A key application-specific feature of the 56F801 is the inclusion of a Pulse Width Modulator (PWM) module. This modules incorporates six complementary, individually programmable PWM signal outputs to enhance motor control functionality. Complementary operation permits programmable dead-time insertion,
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and separate top and bottom output polarity control. The up-counter value is programmable to support a continuously variable PWM frequency. Both edge- and center-aligned synchronous pulse width control (0% to 100% modulation) are supported. The device is capable of controlling most motor types: ACIM (AC Induction Motors), both BDC and BLDC (Brush and Brushless DC motors), SRM and VRM (Switched and Variable Reluctance Motors), and stepper motors. The PWMs incorporate fault protection and cycle-bycycle current limiting with sufficient output drive capability to directly drive standard opto-isolators. A "smoke-inhibit", write-once protection feature for key parameters is also included. The PWM is doublebuffered and includes interrupt control to permit integral reload rates to be programmable from 1 to 16. The PWM modules provide a reference output to synchronize the Analog-to-Digital Converters. The 56F801 incorporates an 8 input, 12-bit Analog-to-Digital Converter (ADC). A full set of standard programmable peripherals is provided that include a Serial Communications Interface (SCI), a Serial Peripheral Interface (SPI), and two Quad Timers. Any of these interfaces can be used as General-Purpose Input/Outputs (GPIO) if that function is not required. An on-chip relaxation oscillator provides flexibility in the choice of either on-chip or externally supplied frequency reference for chip timing operations. Application code is used to select which source is to be used.
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1.3 State of the Art Development Environment
* * Processor ExpertTM (PE) provides a Rapid Application Design (RAD) tool that combines easy-touse component-based software application creation with an expert knowledge system. The Code Warrior Integrated Development Environment is a sophisticated tool for code navigation, compiling, and debugging. A complete set of evaluation modules (EVMs) and development system cards will support concurrent engineering. Together, PE, Code Warrior and EVMs create a complete, scalable tools solution for easy, fast, and efficient development.
1.4 Product Documentation
The four documents listed in Table 1 are required for a complete description and proper design with the 56F801. Documentation is available from local Motorola distributors, Motorola semiconductor sales offices, Motorola Literature Distribution Centers, or online at www.motorola.com/semiconductors.
Table 1. 56F801 Chip Documentation
Topic DSP56800 Family Manual DSP56F801/803/805/807 User's Manual 56F801 Technical Data Sheet 56F801 Product Brief DSP56F801 Errata Description Detailed description of the 56800 family architecture, and 16-bit core processor and the instruction set Detailed description of memory, peripherals, and interfaces of the 56F801, 56F803, 56F805, and 56F807 Electrical and timing specifications, pin descriptions, and package descriptions (this document) Summary description and block diagram of the 56F801 core, memory, peripherals and interfaces Details any chip issues that might be present Order Number DSP56800FM/D
DSP56F801-7UM/D
DSP56F801/D
DSP56F801PB/D
DSP56F801E/D
4
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56F801 Technical Data
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Data Sheet Conventions
1.5 Data Sheet Conventions
This data sheet uses the following conventions:
OVERBAR This is used to indicate a signal that is active when pulled low. For example, the RESET pin is active when low. A high true (active high) signal is high or a low true (active low) signal is low. A high true (active high) signal is low or a low true (active low) signal is high. Signal/Symbol PIN Logic State True False True False Signal State Asserted Deasserted Asserted Deasserted Voltage1 VIL/VOL VIH/VOH VIH/VOH VIL/VOL
"asserted" "deasserted" Examples:
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PIN PIN PIN 1.
Values for VIL, VOL, VIH, and VOH are defined by individual product specifications.
Part 2 Signal/Connection Descriptions
2.1 Introduction
The input and output signals of the 56F801 are organized into functional groups, as shown in Table 2 and as illustrated in Figure 2. In Table 3 through Table 13, each table row describes the signal or signals present on a pin.
Table 2. Functional Group Pin Allocations
Functional Group Power (VDD or VDDA) Ground (VSS or VSSA) Supply Capacitors PLL and Clock Interrupt and Program Control Pulse Width Modulator (PWM) Port Serial Peripheral Interface (SPI) Port1 Serial Communications Interface (SCI) Port1 Analog-to-Digital Converter (ADC) Port Quad Timer Module Port JTAG/On-Chip Emulation (OnCE) 1. Alternately, GPIO pins Number of Pins 5 6 2 2 2 7 4 2 9 3 6 Detailed Description Table 3 Table 4 Table 5 Table 6 Table 7 Table 8 Table 9 Table 10 Table 11 Table 12 Table 13
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Power Port Ground Port Power Port Ground Port
VDD VSS VDDA VSSA
4 5* 1 1 VCAPC PWMA0-5 2 6 1 EXTAL (GPIOB2) XTAL (GPIOB3) FAULTA0
Other Supply Port PLL and Clock or GPIO
1 1
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56F801
1 1 1 1 SCLK (GPIOB4) MOSI (GPIOB5) MISO (GPIOB6) SS (GPIOB7) SPI Port or GPIO
1 1
TXD0 (GPIOB0) RXD0 (GPIOB1)
SCI0 Port or GPIO
8 1
ANA0-7 VREF
ADCA Port
TCK TMS JTAG/OnCE Port TDI TDO TRST DE
3 1 1 1 1 1 1 1 1
TD0-2 (GPIOA0-2)
Quad Timer D or GPIO
IRQA RESET Interrupt/ Program Control
*includes TCS pin which is reserved for factory use and is tied to VSS
Figure 2. 56F801 Signals Identified by Functional Group1
1. Alternate pin functionality is shown in parenthesis.
6
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Power and Ground Signals
2.2 Power and Ground Signals
Table 3. Power Inputs
No. of Pins 4 Signal Name VDD Signal Description Power--These pins provide power to the internal structures of the chip, and should all be attached to VDD. Analog Power--This pin is a dedicated power pin for the analog portion of the chip and should be connected to a low noise 3.3V supply.
1
VDDA
Table 4. Grounds
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No. of Pins 4
Signal Name VSS
Signal Description GND--These pins provide grounding for the internal structures of the chip, and should all be attached to VSS. Analog Ground--This pin supplies an analog ground. TCS--This Schmitt pin is reserved for factory use and must be tied to VSS for normal use. In block diagrams, this pin is considered an additional VSS.
1 1
VSSA TCS
Table 5. Supply Capacitors and VPP
No. of Pins 2 Signal Name VCAPC Signal Type Supply State During Reset Supply Signal Description VCAPC--Connect each pin to a 2.2 For greater bypass capacitor in order to bypass the core logic voltage regulator (required for proper chip operation). For more information, refer to Section 5.2.
2.3 Clock and Phase Locked Loop Signals
Table 6. PLL and Clock
No. of Pins 1 Signal Name EXTAL Signal Type Input State During Reset Input Signal Description External Crystal Oscillator Input--This input should be connected to an 8MHz external crystal or ceramic resonator. For more information, please refer to Section 3.5. Port B GPIO--This multiplexed pin is a General Purpose I/O (GPIO) pin that can be programmed as an input or output pin. This I/O can be utilized when using the on-chip relaxation oscillator so the EXTAL pin is not needed.
GPIOB2
Input/ Output
Input
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Table 6. PLL and Clock (Continued)
No. of Pins 1 Signal Name XTAL Signal Type Output State During Reset Chipdriven Signal Description Crystal Oscillator Output--This output should be connected to an 8MHz external crystal or ceramic resonator. For more information, please refer to Section 3.5. This pin can also be connected to an external clock source. For more information, please refer to Section 3.5.3. GPIOB3 Input/ Output Input Port B GPIO--This multiplexed pin is a General Purpose I/O (GPIO) pin that can be programmed as an input or output pin. This I/O can be utilized when using the on-chip relaxation oscillator so the XTAL pin is not needed.
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2.4 Interrupt and Program Control Signals
Table 7. Interrupt and Program Control Signals
No. of Pins 1 Signal Name IRQA Signal Type Input (Schmitt) State During Reset Input Signal Description
External Interrupt Request A--The IRQA input is a synchronized external interrupt request that indicates that an external device is requesting service. It can be programmed to be level-sensitive or negative-edge- triggered. Reset--This input is a direct hardware reset on the processor. When RESET is asserted low, the hybrid controller is initialized and placed in the Reset state. A Schmitt trigger input is used for noise immunity. When the RESET pin is deasserted, the initial chip operating mode is latched from the EXTBOOT pin. The internal reset signal will be deasserted synchronous with the internal clocks, after a fixed number of internal clocks. To ensure complete hardware reset, RESET and TRST should be asserted together. The only exception occurs in a debugging environment when a hardware device reset is required and it is necessary not to reset the OnCE/JTAG module. In this case, assert RESET, but do not assert TRST.
1
RESET
Input (Schmitt)
Input
2.5 Pulse Width Modulator (PWM) Signals
Table 8. Pulse Width Modulator (PWMA) Signals
No. of Pins 6 1 Signal Name PWMA0-5 FAULTA0 Signal Type Output Input (Schmitt) State During Reset Tri-stated Input Signal Description PWMA0-5-- These are six PWMA output pins. FAULTA0-- This fault input pin is used for disabling selected PWMA outputs in cases where fault conditions originate offchip.
8
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Serial Peripheral Interface (SPI) Signals
2.6 Serial Peripheral Interface (SPI) Signals
Table 9. Serial Peripheral Interface (SPI) Signals
No. of Pins 1 Signal Name MISO Signal Type Input/ Output State During Reset Input Signal Description
SPI Master In/Slave Out (MISO)--This serial data pin is an input to a master device and an output from a slave device. The MISO line of a slave device is placed in the highimpedance state if the slave device is not selected. Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that can be individually programmed as input or output pin. After reset, the default state is MISO.
GPIOB6
Input/ Output
Input
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1
MOSI
Input/ Output
Input
SPI Master Out/Slave In (MOSI)--This serial data pin is an output from a master device and an input to a slave device. The master device places data on the MOSI line a half-cycle before the clock edge that the slave device uses to latch the data. Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that can be individually programmed as input or output pin. After reset, the default state is MOSI.
GPIOB5
Input/ Output
Input
1
SCLK
Input/ Output
Input
SPI Serial Clock--In master mode, this pin serves as an output, clocking slaved listeners. In slave mode, this pin serves as the data clock input. Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that can be individually programmed as an input or output pin. After reset, the default state is SCLK.
GPIOB4
Input/ Output
Input
1
SS
Input
Input
SPI Slave Select--In master mode, this pin is used to arbitrate multiple masters. In slave mode, this pin is used to select the slave. Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that can be individually programmed as an input or output pin. After reset, the default state is SS.
GPIOB7
Input/ Output
Input
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2.7 Serial Communications Interface (SCI) Signals
Table 10. Serial Communications Interface (SCI0) Signals
No. of Pins 1 Signal Name TXD0 GPIOB0 Signal Type Output Input/ Output State During Reset Input Input Signal Description Transmit Data (TXD0)--SCI0 transmit data output Port B GPIO--This pin is a General Purpose I/O (GPIO) pin that can be individually programmed as an input or output pin. After reset, the default state is SCI output.
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1
RXD0 GPIOB1
Input Input/ Output
Input Input
Receive Data (RXD0)--SCI0 receive data input Port B GPIO--This pin is a General Purpose I/O (GPIO) pin that can be individually programmed as an input or output pin. After reset, the default state is SCI input.
2.8 Analog-to-Digital Converter (ADC) Signals
Table 11. Analog to Digital Converter Signals
No. of Pins 4 4 1 Signal Name ANA0-3 ANA4-7 VREF Signal Type Input Input Input State During Reset Input Input Input Signal Description ANA0-3--Analog inputs to ADC, channel 1 ANA4-7--Analog inputs to ADC, channel 2 VREF--Analog reference voltage for ADC. Must be set to VDDA-0.3V for optimal performance.
2.9 Quad Timer Module Signals
Table 12. Quad Timer Module Signals
No. of Pins 3 Signal Name TD0-2 Signal Type Input/ Output Input/ Output State During Reset Input Signal Description TD0-2--Timer D Channel 0-2
GPIOA0-2
Input
Port A GPIO--This pin is a General Purpose I/O (GPIO) pin that can be individually programmed as an input or output pin. After reset, the default state is the quad timer input.
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JTAG/OnCE
2.10 JTAG/OnCE
Table 13. JTAG/On-Chip Emulation (OnCE) Signals
No. of Pins 1 Signal Name TCK Signal Type Input (Schmitt) State During Reset Signal Description
Input, pulled Test Clock Input--This input pin provides a gated clock to low internally synchronize the test logic and shift serial data to the JTAG/OnCE port. The pin is connected internally to a pull-down resistor.
1
TMS
Input Input, pulled Test Mode Select Input--This input pin is used to sequence the JTAG (Schmitt) high internally TAP controller's state machine. It is sampled on the rising edge of TCK and has an on-chip pull-up resistor. Input Input, pulled Test Data Input--This input pin provides a serial input data stream to (Schmitt) high internally the JTAG/OnCE port. It is sampled on the rising edge of TCK and has an on-chip pull-up resistor. Output Tri-stated Test Data Output--This tri-statable output pin provides a serial output data stream from the JTAG/OnCE port. It is driven in the Shift-IR and Shift-DR controller states, and changes on the falling edge of TCK.
1
TDI
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1
TDO
1
TRST
Input Input, pulled Test Reset--As an input, a low signal on this pin provides a reset (Schmitt) high internally signal to the JTAG TAP controller. To ensure complete hardware reset, TRST should be asserted whenever RESET is asserted. The only exception occurs in a debugging environment when a hardware device reset is required and it is necessary not to reset the OnCE/JTAG module. In this case, assert RESET, but do not assert TRST. Output Output Debug Event--DE provides a low pulse on recognized debug events.
1
DE
Part 3 Specifications
3.1 General Characteristics
The 56F801 is fabricated in high-density CMOS with 5-volt tolerant TTL-compatible digital inputs. The term "5-volt tolerant" refers to the capability of an I/O pin, built on a 3.3V compatible process technology, to withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V and 5V- compatible I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V 10% during normal operation without causing damage). This 5V-tolerant capability therefore offers the power savings of 3.3V I/O levels while being able to receive 5V levels without being damaged. Absolute maximum ratings given in Table 14 are stress ratings only, and functional operation at the maximum is not guaranteed. Stress beyond these ratings may affect device reliability or cause permanent damage to the device. The 56F801 DC and AC electrical specifications are preliminary and are from design simulations. These specifications may not be fully tested or guaranteed at this early stage of the product life cycle. Finalized specifications will be published after complete characterization and device qualifications have been completed.
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CAUTION
This device contains protective circuitry to guard against damage due to high static voltage or electrical fields. However, normal precautions are advised to avoid application of any voltages higher than maximum rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate voltage level.
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Table 14. Absolute Maximum Ratings
Characteristic Supply voltage All other input voltages, excluding Analog inputs Analog inputs ANA0-7 and VREF Analog inputs EXTAL, XTAL Current drain per pin excluding VDD, VSS, & PWM ouputs Symbol VDD VIN VIN VIN I Min VSS - 0.3 VSS - 0.3 VSSA- 0.3 VSSA- 0.3 -- Max VSS + 4.0 VSS + 5.5V VDDA+ 0.3 VSSA+ 3.0 10 Unit V V V V mA
Table 15. Recommended Operating Conditions
Characteristic Supply voltage, digital Supply Voltage, analog ADC reference voltage Ambient operating temperature Symbol VDD VDDA VREF TA Min 3.0 3.0 2.7 -40 Typ 3.3 3.3 - - Max 3.6 3.6 VDDA 85 Unit V V V C
12
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General Characteristics
Table 16. Thermal Characteristics6
Value Characteristic
Comments
Symbol 48-pin LQFP
Unit
Notes
Junction to ambient Natural convection Junction to ambient (@1m/sec) Junction to ambient Natural convection Junction to ambient (@1m/sec) Four layer board (2s2p)
RJA RJMA RJMA (2s2p) RJMA RJC JT P I/O PD PDMAX
50.6 47.4 39.1
C/W C/W C/W
2 2 1,2
Four layer board (2s2p)
37.9 17.3 1.2 User Determined P D = (IDD x VDD + P I/O) (TJ - TA) /JA
C/W C/W C/W W W C
1,2 3 4, 5
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Junction to case Junction to center of case I/O pin power dissipation Power dissipation Junction to center of case
Notes:
1. 2. Theta-JA determined on 2s2p test boards is frequently lower than would be observed in an application. Determined on 2s2p thermal test board. Junction to ambient thermal resistance, Theta-JA (RJA) was simulated to be equivalent to the JEDEC specification JESD51-2 in a horizontal configuration in natural convection. Theta-JA was also simulated on a thermal test board with two internal planes (2s2p where s is the number of signal layers and p is the number of planes) per JESD51-6 and JESD51-7. The correct name for Theta-JA for forced convection or with the non-single layer boards is Theta-JMA. Junction to case thermal resistance, Theta-JC (RJC ), was simulated to be equivalent to the measured values using the cold plate technique with the cold plate temperature used as the "case" temperature. The basic cold plate measurement technique is described by MIL-STD 883D, Method 1012.1. This is the correct thermal metric to use to calculate thermal performance when the package is being used with a heat sink. Thermal Characterization Parameter, Psi-JT (JT ), is the "resistance" from junction to reference point thermocouple on top center of case as defined in JESD51-2. JT is a useful value to use to estimate junction temperature in steady state customer environments. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. See Section 5.1 from more details on thermal design considerations.
3.
4.
5.
6.
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3.2 DC Electrical Characteristics
Table 17. DC Electrical Characteristics
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6V, TA = -40 to +85C, CL 50pF
Characteristic Input high voltage (XTAL/EXTAL) Input low voltage (XTAL/EXTAL) Input high voltage [GPIOB(2:3)]1 Input low voltage [GPIOB(2:3)]1 Symbol VIHC VILC VIH[GPIOB(2:3)] VIL[GPIOB(2:3)] VIHS VILS VIH VIL IIH IIL IIHPU IILPU IIHPD IILPD RPU, RPD IOZL IOZH IIHA IILA VOH VOL IOH IOL IOHP -10 -10 -15 -15 VDD - 0.7 -- 4 4 10 Min 2.25 0 2.0 -0.3 2.2 -0.3 2.0 -0.3 -1 -1 -1 -210 20 -1 Typ -- -- -- -- -- -- -- -- -- -- -- -- -- -- 30 -- -- -- -- -- -- -- -- -- 10 10 15 15 -- 0.4 -- -- -- Max 2.75 0.5 3.6 0.8 5.5 0.8 5.5 0.8 1 1 1 -50 180 1 Unit V V V V V V V V A A A A A A K A A A A V V mA mA mA
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Input high voltage (Schmitt trigger inputs)2 Input low voltage (Schmitt trigger inputs)2 Input high voltage (all other digital inputs) Input low voltage (all other digital inputs) Input current high (pullup/pulldown resistors disabled, VIN=VDD) Input current low (pullup/pulldown resistors disabled, VIN=VSS) Input current high (with pullup resistor, VIN=VDD) Input current low (with pullup resistor, VIN=VSS) Input current high (with pulldown resistor, VIN=VDD) Input current low (with pulldown resistor, VIN=VSS) Nominal pullup or pulldown resistor value Output tri-state current low Output tri-state current high Input current high (analog inputs, VIN=VDDA)3 Input current low (analog inputs, VIN=VSSA)3 Output High Voltage (at IOH) Output Low Voltage (at IOL) Output source current Output sink current PWM pin output source current4
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DC Electrical Characteristics
Table 17. DC Electrical Characteristics (Continued)
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6V, TA = -40 to +85C, CL 50pF
Characteristic PWM pin output sink current5 Input capacitance Output capacitance VDD supply current Run7 (80MHz operation) Symbol IOLP CIN COUT IDDT6 -- -- -- -- VEIO VEIC VPOR 2.4 2.0 -- 120 102 96 62 2.7 2.2 1.7 130 111 102 70 3.0 2.4 2.0 mA mA mA mA V V V Min 16 -- -- Typ -- 8 12 Max -- -- -- Unit mA pF pF
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Run7 (60MHz operation) Wait8 Stop Low Voltage Interrupt, external power supply9 Low Voltage Interrupt, internal power supply10 Power on Reset11
1. Since the GPIOB[2:3] signals are shared with the XTAL/EXTAL function, these inputs are not 5.5 volt tolerant. 2. Schmitt Trigger inputs are: FAULTA0, IRQA, RESET, TCS, TCK, TMS, TDI, and TRST. 3. Analog inputs are: ANA[0:7], XTAL and EXTAL. Specification assumes ADC is not sampling. 4. PWM pin output source current measured with 50% duty cycle. 5. PWM pin output sink current measured with 50% duty cycle. 6. IDDT = IDD + IDDA (Total supply current for VDD + VDDA) 7. Run (operating) IDD measured using 8MHz clock source. All inputs 0.2V from rail; outputs unloaded. All ports configured as inputs; measured with all modules enabled. 8. Wait IDD measured using external square wave clock source (fosc = 8MHz) into XTAL; all inputs 0.2V from rail; no DC loads; less than 50pF on all outputs. CL = 20pF on EXTAL; all ports configured as inputs; EXTAL capacitance linearly affects wait IDD; measured with PLL enabled. 9. This low voltage interrupt monitors the VDDA external power supply. VDDA is generally connected to the same potential as VDD via separate traces. If VDDA drops below VEIO, an interrupt is generated. Functionality of the device is guaranteed under transient conditions when VDDA>VEIO (between the minimum specified VDD and the point when the VEIO interrupt is generated). 10. This low voltage interrupt monitors the internally regulated core power supply. If the output from the internal voltage is regulator drops below VEIC, an interrupt is generated. Since the core logic supply is internally regulated, this interrupt will not be generated unless the external power supply drops below the minimum specified value (3.0V). 11. Power-on reset occurs whenever the internally regulated 2.5V digital supply drops below 1.5V typical. While power is ramping up, this signal remains active for as long as the internal 2.5V is below 1.5V typical no matter how long the ramp up rate is. The internally regulated voltage is typically 100 mV less than VDD during ramp up until 2.5V is reached, at which time it self regulates.
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160
IDD Digital IDD Analog IDD Total
120
IDD (mA)
80
Freescale Semiconductor, Inc...
40
0
10
20
30
40 Freq. (MHz)
50
60
70
80
Figure 3. Maximum Run IDD vs. Frequency (see Note 7. in Table 17)
3.3 AC Electrical Characteristics
Timing waveforms in Section 3.3 are tested using the VIL and VIH levels specified in the DC Characteristics table. In Figure 4 the levels of VIH and VIL for an input signal are shown.
VIH Input Signal Midpoint1 Fall Time
Note: The midpoint is VIL + (VIH - VIL)/2.
Low
High
90% 50% 10%
VIL
Rise Time
Figure 4. Input Signal Measurement References
Figure 5 shows the definitions of the following signal states: * * * * Active state, when a bus or signal is driven, and enters a low impedance state. Tri-stated, when a bus or signal is placed in a high impedance state. Data Valid state, when a signal level has reached VOL or VOH. Data Invalid state, when a signal level is in transition between VOL and VOH.
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Freescale Semiconductor, Inc.
Flash Memory Characteristics
Data1 Valid Data1 Data Invalid State Data Active
Data2 Valid Data2 Data Tri-stated
Data3 Valid Data3
Data Active
Figure 5. Signal States
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3.4 Flash Memory Characteristics
Table 18. Flash Memory Truth Table
Mode Standby Read Word Program Page Erase Mass Erase 1. 2. 3. 4. 5. 6. 7. 8. XE1 L H H H H YE2 L H H L L SE3 L H L L L OE4 L H L L L PROG5 L L H L L ERASE6 L L L H H MAS17 L L L L H NVSTR8 L L H H H
X address enable, all rows are disabled when XE = 0 Y address enable, YMUX is disabled when YE = 0 Sense amplifier enable Output enable, tri-state Flash data out bus when OE = 0 Defines program cycle Defines erase cycle Defines mass erase cycle, erase whole block Defines non-volatile store cycle
Table 19. IFREN Truth Table
Mode Read Word program Page erase Mass erase IFREN = 1 Read information block Program information block Erase information block Erase both block IFREN = 0 Read main memory block Program main memory block Erase main memory block Erase main memory block
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Table 20. Flash Timing Parameters
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6V, TA = -40 to +85C, CL 50pF
Characteristic Program time Erase time Mass erase time Endurance1 Symbol Min 20 20 100 10,000 10 Typ - - - 20,000 30 Max - - - - - Unit us ms ms cycles years Figure Figure 6 Figure 7 Figure 8
Tprog* Terase* Tme*
ECYC DRET
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Data Retention1 @ 5000 cycles
The following parameters should only be used in the Manual Word Programming Mode PROG/ERASE to NVSTR set up time NVSTR hold time NVSTR hold time (mass erase) NVSTR to program set up time Recovery time Cumulative program HV period2 Program hold time3 Address/data set up time3 Address/data hold time3
Tnvs* Tnvh* Tnvh1* Tpgs* Trcv* Thv Tpgh Tads Tadh
- - - - - -
5 5 100 10 1 3
- - - - - -
us us us us us ms
Figure 6, Figure 7, Figure 8 Figure 6, Figure 7 Figure 8 Figure 6 Figure 6, Figure 7, Figure 8 Figure 6
- - -
- - -
- - -
Figure 6 Figure 6 Figure 6
1. One cycle is equal to an erase program and read. 2. Thv is the cumulative high voltage programming time to the same row before next erase. The same address cannot be programmed twice before next erase. 3. Parameters are guaranteed by design in smart programming mode and must be one cycle or greater. *The Flash interface unit provides registers for the control of these parameters.
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56F801 Technical Data
Freescale Semiconductor, Inc.
Flash Memory Characteristics
IFREN
XADR
XE Tadh YADR
YE
Freescale Semiconductor, Inc...
DIN Tads PROG Tnvs NVSTR Tpgs Thv Tnvh Trcv Tprog Tpgh
Figure 6. Flash Program Cycle
IFREN
XADR
XE
YE=SE=OE=MAS1=0
ERASE Tnvs NVSTR Tnvh Terase Trcv
Figure 7. Flash Erase Cycle
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IFREN
XADR
XE
MAS1
YE=SE=OE=0
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ERASE Tnvs NVSTR Tnvh1 Tme Trcv
Figure 8. Flash Mass Erase Cycle
3.5 External Clock Operation
The 56F801 device clock is derived from either 1) an internal crystal oscillator circuit working in conjunction with an external crystal, 2) an external frequency source, or 3) an on-chip relaxation oscillator. To generate a reference frequency using the internal crystal oscillator circuit, a reference crystal external to the chip must be connected between the EXTAL and XTAL pins. Paragrahs 3.5.1 and 3.5.4 describe these methods of clocking. Whichever type of clock derivation is used provides a reference signal to a phaselocked loop (PLL) within the 56F801. In turn, the PLL generates a master reference frequency that determines the speed at which chip operations occur. Application code can be set to change the frequency source between the relaxation oscillator and crystal oscillator or external source, and power down the relaxation oscillator if desired. Selection of which clock is used is determined by setting the PRECS bit in the PLLCR (phase-locked loop control register) word (bit 2). If the bit is set to 1, the external crystal oscillator circuit is selected. If the bit is set to 0, the internal relaxation oscillator is selected, and this is the default value of the bit when power is first applied.
3.5.1
Crystal Oscillator
The internal oscillator is also designed to interface with a parallel-resonant crystal resonator in the frequency range specified for the external crystal in Table 23. Figure 9 shows a recommended crystal oscillator circuit. Follow the crystal supplier's recommendations when selecting a crystal, since crystal parameters determine the component values required to provide maximum stability and reliable start-up. The crystal and associated components should be mounted as close as possible to the EXTAL and XTAL pins to minimize output distortion and start-up stabilization time. The internal 56F80x oscillator circuitry is designed to have no external load capacitors present. As shown in Figure 10 no external load capacitors should be used.
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External Clock Operation
The 56F80x components internally are modeled as a parallel resonant oscillator circuit to provide a capacitive load on each of the oscillator pins (XTAL and EXTAL) of 10pF to 13pF over temperature and process variations. Using a typical value of internal capacitance on these pins of 12pF and a value of 3pF as a typical circuit board trace capacitance the parallel load capacitance presented to the crystal is 9pF as determined by the following equation:
CL1 * CL2 CL = CL1 + CL2 + Cs = 12 + 12
12 * 12 + 3 = 6 + 3 = 9pF
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This is the value load capacitance that should be used when selecting a crystal and determining the actual frequency of operation of the crystal oscillator circuit.
EXTAL XTAL Rz
fc Recommended External Crystal Parameters: Rz = 1 to 3 M fc = 8MHz (optimized for 8MHz)
Figure 9. External Crystal Oscillator Circuit
3.5.2
Ceramic Resonator
It is also possible to drive the internal oscillator with a ceramic resonator, assuming the overall system design can tolerate the reduced signal integrity. In Figure 10, a typical ceramic resonator circuit is shown. Refer to supplier's recommendations when selecting a ceramic resonator and associated components. The resonator and components should be mounted as close as possible to the EXTAL and XTAL pins. The internal 56F80x oscillator circuitry is designed to have no external load capacitors present. As shown in Figure 9 no external load capacitors should be used.
EXTAL XTAL Rz
fc Recommended Ceramic Resonator Parameters: Rz = 1 to 3 M fc = 8MHz (optimized for 8MHz)
Figure 10. Connecting a Ceramic Resonator
Note: Motorola recommends only two terminal ceramic resonators vs. three terminal resonators (which contain an internal bypass capacitor to ground).
3.5.3
External Clock Source
The recommended method of connecting an external clock is given in Figure 11. The external clock source is connected to XTAL and the EXTAL pin is grounded.
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56F801 XTAL EXTAL External Clock VSS
Figure 11. Connecting an External Clock Signal Table 21. External Clock Operation Timing Requirements3
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C
Characteristic Symbol fosc tPW Min 0 6.25 Typ -- -- Max 802 -- Unit MHz ns
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Frequency of operation (external clock driver)1 Clock Pulse Width3, 4 1. 2. 3. 4.
See Figure 11 for details on using the recommended connection of an external clock driver. May not exceed 60MHz for the DSP56F801FA60 device. The high or low pulse width must be no smaller than 6.25ns or the chip will not function. Parameters listed are guaranteed by design. VIH
External Clock
90% 50% 10%
90% 50% 10%
tPW Note: The midpoint is VIL + (VIH - VIL)/2.
tPW
VIL
Figure 12. External Clock Timing
3.5.4
Use of On-Chip Relaxation Oscillator
An internal relaxation oscillator can supply the reference frequency when an external frequency source or crystal are not used. During a 56F801 boot or reset sequence, the relaxation oscillator is enabled by default, and the PRECS bit in the PLLCR word is set to 0 (Section 3.5). If an external oscillator is connected, the relaxation oscillator can be deselected instead by setting the PRECS bit in the PLLCR to 1. When this occurs, the PRECSS bit in the PLLSR (prescaler clock select status register) data word also sets to 1. If a changeover between internal and external oscillators is required at startup, internal device circuits compensate for any asynchronous transitions between the two clock signals so that no glitches occur in the resulting master clock to the chip. When changing clocks, the user must ensure that the clock source is not switched until the desired clock is enabled and stable. To compensate for variances in the device manufacturing process, the accuracy of the relaxation oscillator can be incrementally adjusted to within 0.25% of 8MHz by trimming an internal capacitor. Bits 0-7 of the IOSCTL (internal oscillator control) word allow the user to set in an additional offset (trim) to this preset value to increase or decrease capacitance. The default value of this trim is 128 units, making the power-up default capacitor size 432 units. Each unit added or deleted changes the output frequency by about 0.2%, allowing incremental adjustment until the desired frequency accuracy is achieved.
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56F801 Technical Data
Freescale Semiconductor, Inc.
External Clock Operation
Table 22. Relaxation Oscillator Characteristics
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C
Characteristic Frequency Accuracy1 Frequency Drift over Temp Frequency Drift over Supply Trim Accuracy 1. Over full temperature range. Symbol f f/t f/V fT Min -- -- -- -- Typ +2 +0.1 0.1 +0.25 Max +5 -- -- -- Unit % %/oC %/V %
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8.2
8.1
Output Frequency
8.0
7.9
7.8
7.7
7.6
-40
-25
-5
15
35
55
75
85
Temperature (oC)
Figure 13. Typical Relaxation Oscillator Frequency vs. Temperature (Trimmed to 8MHz @ 25oC)
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11
10
9
8
7
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6
5 0 10 20 30 40 50 60 70 80 90 A0 B0 C0 D0 E0 F0
Figure 14. Typical Relaxation Oscillator Frequency vs. Trim Value @ 25oC
3.5.5
Phase Locked Loop Timing
Table 23. PLL Timing
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C
Characteristic External reference crystal frequency for the PLL1 PLL output frequency2 PLL stabilization time4 0o to +85oC PLL stabilization time4 -40o to 0oC Symbol fosc fout/2 tplls tplls Min 4 40 -- -- Typ 8 -- 10 100 Max 10 803 -- 200 Unit MHz MHz ms ms
1. An externally supplied reference clock should be as free as possible from any phase jitter for the PLL to work correctly. The PLL is optimized for 8MHz input crystal. 2. ZCLK may not exceed 80MHz. For additional information on ZCLK and fout/2, please refer to the OCCS chapter in the User Manual. ZCLK = fop 3. Will not exceed 60MHz for the DSP56F801FA60 device. 4. This is the minimum time required after the PLL setup is changed to ensure reliable operation.
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Reset, Stop, Wait, Mode Select, and Interrupt Timing
3.6 Reset, Stop, Wait, Mode Select, and Interrupt Timing
Table 24. Reset, Stop, Wait, Mode Select, and Interrupt Timing1, 5
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C, CL 50pF
Characteristic RESET Assertion to Address, Data and Control Signals High Impedance Minimum RESET Assertion Duration2 OMR Bit 6 = 0 OMR Bit 6 = 1 Symbol tRAZ tRA 275,000T 128T tRDA tIRW tIDM 33T -- -- 34T ns ns ns Figure 15 Min -- Max 21 Unit ns See Figure 15
Figure 15
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RESET De-assertion to First External Address Output Edge-sensitive Interrupt Request Width IRQA, IRQB Assertion to External Data Memory Access Out Valid, caused by first instruction execution in the interrupt service routine IRQA, IRQB Assertion to General Purpose Output Valid, caused by first instruction execution in the interrupt service routine IRQA Low to First Valid Interrupt Vector Address Out recovery from Wait State3 IRQA Width Assertion to Recover from Stop State4 Delay from IRQA Assertion to Fetch of first instruction (exiting Stop) OMR Bit 6 = 0 OMR Bit 6 = 1 Duration for Level Sensitive IRQA Assertion to Cause the Fetch of First IRQA Interrupt Instruction (exiting Stop) OMR Bit 6 = 0 OMR Bit 6 = 1 Delay from Level Sensitive IRQA Assertion to First Interrupt Vector Address Out Valid (exiting Stop) OMR Bit 6 = 0 OMR Bit 6 = 1 1. 2.
1.5T 15T
-- --
ns ns
Figure 16 Figure 17
tIG
16T
--
ns
Figure 17
tIRI
13T
--
ns
Figure 18
tIW tIF
2T
--
ns
Figure 19 Figure 19
-- -- tIRQ
275,000T 12T
ns ns Figure 20
-- -- tII -- --
275,000T 12T
ns ns Figure 20
275,000T 12T
ns ns
In the formulas, T = clock cycle. For an operating frequency of 80MHz, T = 12.5ns. Circuit stabilization delay is required during reset when using an external clock or crystal oscillator in two cases: * After power-on reset * When recovering from Stop state 3. The minimum is specified for the duration of an edge-sensitive IRQA interrupt required to recover from the Stop state. This is not the minimum required so that the IRQA interrupt is accepted. 4. The interrupt instruction fetch is visible on the pins only in Mode 3. 5. Parameters listed are guaranteed by design.
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RESET tRAZ tRA tRDA
A0-A15, D0-D15 PS, DS, RD, WR
First Fetch
First Fetch
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Figure 15. Asynchronous Reset Timing
IRQA, IRQB
tIRW
Figure 16. External Interrupt Timing (Negative-Edge-Sensitive)
A0-A15,
PS, DS, RD, WR tIDM IRQA, IRQB
First Interrupt Instruction Execution
a) First Interrupt Instruction Execution
General Purpose I/O Pin
tIG IRQA, IRQB
b) General Purpose I/O
Figure 17. External Level-Sensitive Interrupt Timing
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Reset, Stop, Wait, Mode Select, and Interrupt Timing
IRQA, IRQB
tIRI
A0-A15, PS, DS, RD, WR
First Interrupt Vector Instruction Fetch
Figure 18. Interrupt from Wait State Timing
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tIW
IRQA
tIF
A0-A15, PS, DS, RD, WR
First Instruction Fetch Not IRQA Interrupt Vector
Figure 19. Recovery from Stop State Using Asynchronous Interrupt Timing
tIRQ
IRQA
tII
A0-A15 PS, DS, RD, WR
First IRQA Interrupt Instruction Fetch
Figure 20. Recovery from Stop State Using IRQA Interrupt Service
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3.7 Serial Peripheral Interface (SPI) Timing
Table 25. SPI Timing1
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C, CL 50pF
Characteristic Cycle time Master Slave Enable lead time Master Slave Symbol tC 50 25 tELD -- 25 tELG -- 100 tCH 17.6 12.5 tCL 24.1 25 tDS 20 0 tDH 0 2 tA 4.8 15 ns -- -- ns ns -- -- ns ns -- -- ns ns -- -- ns ns -- -- ns ns Figures 21, 22, 23, 24 -- -- ns ns Figure 24 -- -- ns ns Min Max Unit See Figure Figures 21, 22, 23, 24
Figure 24
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Enable lag time Master Slave Clock (SCK) high time Master Slave Clock (SCK) low time Master Slave Data setup time required for inputs Master Slave Data hold time required for inputs Master Slave Access time (time to data active from highimpedance state) Slave Disable time (hold time to high-impedance state) Slave Data Valid for outputs Master Slave (after enable edge) Data invalid Master Slave Rise time Master Slave Fall time Master Slave 1. Parameters listed are guaranteed by design.
Figures 21, 22, 23, 24
Figures 21, 22, 23, 24
Figures 21, 22, 23, 24
Figure 24
tD 3.7 tDV -- -- tDI 0 0 tR -- -- tF -- -- 9.7 9.0 ns ns 11.5 10.0 ns ns -- -- ns ns 4.5 20.4 ns ns 15.2 ns
Figure 24
Figures 21, 22, 23, 24
Figures 21, 22, 23, 24
Figures 21, 22, 23, 24
Figures 21, 22, 23, 24
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Serial Peripheral Interface (SPI) Timing
SS
(Input)
SS is held High on master
tC tR tCL tCH tCL tF tR tF
SCLK (CPOL = 0) (Output)
SCLK (CPOL = 1) (Output)
tDH tDS
tCH
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MISO (Input)
MSB in
tDI
Bits 14-1
tDV
LSB in
tDI(ref)
MOSI (Output)
Master MSB out
tF
Bits 14-1
Master LSB out
tR
Figure 21. SPI Master Timing (CPHA = 0)
SS
(Input)
tC
SS is held High on master
tF tR tCL tCH tCL tF
SCLK (CPOL = 0) (Output)
SCLK (CPOL = 1) (Output)
tCH tR tDS tDH
MISO (Input)
tDV(ref)
MSB in
tDI
Bits 14-1
tDV
LSB in
MOSI (Output)
Master MSB out
tF
Bits 14- 1
Master LSB out
tR
Figure 22. SPI Master Timing (CPHA = 1)
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SS
(Input)
tC tCL tR
tF
tELG
SCLK (CPOL = 0) (Input)
tELD
tCH tCL
SCLK (CPOL = 1) (Input)
tA tCH tR tF tD
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MISO (Output)
tDS
Slave MSB out
tDH
Bits 14-1
tDV
Slave LSB out
tDI tDI
MOSI (Input)
MSB in
Bits 14-1
LSB in
Figure 23. SPI Slave Timing (CPHA = 0)
SS
(Input)
tC tCL tR tCH tELD
tF
SCLK (CPOL = 0) (Input)
tELG tCL
SCLK (CPOL = 1) (Input)
tDV tA
tCH
tR tF
tD
MISO (Output)
tDS
Slave MSB out
tDH
Bits 14-1
tDV
Slave LSB out
tDI
MOSI (Input)
MSB in
Bits 14-1
LSB in
Figure 24. SPI Slave Timing (CPHA = 1)
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Quad Timer Timing
3.8 Quad Timer Timing
Table 26. Timer Timing1, 2
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C, CL 50pF
Characteristic Timer input period Timer input high/low period Timer output period Timer output high/low period Symbol PIN PINHL POUT POUTHL Min 4T+6 2T+3 2T 1T Max -- -- -- -- Unit ns ns ns ns
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1. 2.
In the formulas listed, T = clock cycle. For 80MHz operation, T = 12.5ns. Parameters listed are guaranteed by design.
Timer Inputs
PIN PINHL PINHL
Timer Outputs
POUT POUTHL POUTHL
Figure 25. Timer Timing
3.9 Serial Communication Interface (SCI) Timing
Table 27. SCI Timing4
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C, CL 50pF
Characteristic Baud Rate1 RXD2 Pulse Width TXD3 Pulse Width 1. 2. 3. 4. Symbol BR RXDPW TXDPW Min Max (fMAX*2.5)/(80) 1.04/BR 1.04/BR Unit Mbps ns ns
--
0.965/BR 0.965/BR
fMAX is the frequency of operation of the system clock in MHz. The RXD pin in SCI0 is named RXD0 and the RXD pin in SCI1 is named RXD1. The TXD pin in SCI0 is named TXD0 and the TXD pin in SCI1 is named TXD1. Parameters listed are guaranteed by design.
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RXD SCI receive data pin (Input)
RXDPW
Figure 26. RXD Pulse Width
TXD SCI receive data pin (Input)
TXDPW
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Figure 27. TXD Pulse Width
3.10 Analog-to-Digital Converter (ADC) Characteristics
Table 28. ADC Characteristics
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, VREF = VDD-0.3V, ADCDIV = 4, 9, or 14 (for optimal
performance), ADC clock = 4MHz, 3.0-3.6 V, TA = -40 to +85C, CL 50pF Characteristic ADC input voltages Resolution Integral Non-Linearity3 Differential Non-Linearity Monotonicity ADC internal clock5 Conversion range Conversion time Sample time Input capacitance Gain Error (transfer gain)5 Offset Voltage5 Total Harmonic Distortion5 Signal-to-Noise plus Distortion5 Effective Number of Bits5 fADIC RAD tADC tADS CADI EGAIN VOFFSET THD SINAD ENOB 0.5 VSSA -- -- -- 1.00 +10 55 54 8.5 Symbol VADCIN RES INL DNL Min 01 12 -- -- Typ -- -- +/- 4 +/- 0.9 GUARANTEED -- -- 6 1 5 1.10 +230 60 56 9.5 5 VDDA -- -- -- 1.15 +325 -- -- -- MHz V tAIC cycles6 tAIC cycles6 pF6 -- mV dB dB bit Max VREF2 12 +/- 5 +/- 1 Unit V Bits LSB4 LSB4
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Analog-to-Digital Converter (ADC) Characteristics
Table 28. ADC Characteristics (Continued)
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, VREF = VDD-0.3V, ADCDIV = 4, 9, or 14 (for optimal
performance), ADC clock = 4MHz, 3.0-3.6 V, TA = -40 to +85C, CL 50pF Characteristic Spurious Free Dynamic Range5 Bandwidth ADC Quiescent Current (both ADCs) VREF Quiescent Current (both ADCs) Symbol SFDR BW IADC IVREF Min 60 -- -- -- Typ 65 100 50 12 Max -- -- -- 16.5 Unit dB KHz mA mA
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1. For optimum ADC performance, keep the minimum VADCIN value > 250mV. Inputs less than 250mV volts may convert to a digital output code of 0 or cause erroneous conversions. 2. VREF must be equal to or less than VDDA and must be greater than 2.7V. For optimal ADC performance, set VREF to VDDA-0.3V.
3.
4. 5. 6.
Measured in 10-90% range.
LSB = Least Significant Bit. Guaranteed by characterization. tAIC = 1/fADIC
ADC analog input
3
1
2
4
Figure 28. Equivalent Analog Input Circuit
1. 2. 3. Parasitic capacitance due to package, pin to pin, and pin to package base coupling. (1.8pf) Parasitic capacitance due to the chip bond pad, ESD protection devices and signal routing. (2.04pf) Equivalent resistance for the ESD isolation resistor and the channel select mux. (500 ohms)
4. Sampling capacitor at the sample and hold circuit. Capacitor 4 is normally disconnected from the input and is only connected to it at sampling time. (1pf)
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3.11 JTAG Timing
Table 29. JTAG Timing 1, 3
Operating Conditions: VSS = VSSA = 0 V, VDD = VDDA = 3.0-3.6 V, TA = -40 to +85C, CL 50pF
Characteristic TCK frequency of operation2 TCK cycle time TCK clock pulse width TMS, TDI data setup time Symbol fOP tCY tPW tDS tDH tDV tTS tTRST tDE Min DC 100 50 0.4 1.2 -- -- 50 8T Max 10 -- -- -- -- 26.6 23.5 -- -- Unit MHz ns ns ns ns ns ns ns ns
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TMS, TDI data hold time TCK low to TDO data valid TCK low to TDO tri-state TRST assertion time DE assertion time
1. Timing is both wait state and frequency dependent. For the values listed, T = clock cycle. For 80MHz operation, T = 12.5ns. 2. TCK frequency of operation must be less than 1/8 the processor rate. 3. Parameters listed are guaranteed by design. tCY tPW
VIH
tPW
VM
TCK (Input) VM = VIL + (VIH - VIL)/2
VM VIL
Figure 29. Test Clock Input Timing Diagram
34
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56F801 Technical Data
Freescale Semiconductor, Inc.
JTAG Timing
TCK (Input) TDI TMS (Input) TDO (Output)
tTS
tDS
tDH
Input Data Valid
tDV
Output Data Valid
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TDO (Output)
tDV
TDO (Output)
Output Data Valid
Figure 30. Test Access Port Timing Diagram
TRST
(Input)
tTRST
Figure 31. TRST Timing Diagram
DE tDE
Figure 32. OnCE--Debug Event
56F801 Technical Data
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Part 4 Packaging
4.1 Package and Pin-Out Information 56F801
This section contains package and pin-out information for the 48-pin LQFP configuration of the 56F801.
VCAPC1
PWMA5
PWMA4
PWMA3
PWMA2
PWMA1
PWMA0
ANA7
ANA6
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TDO TD1 TD2 /SS MISO MOSI SCLK TXDO VSS VDD RXD0 DE
ORIENTATION MARK PIN 37 PIN 1
ANA5
VDD
VSS
ANA4 ANA3 VREF
Motorola 56F801
PIN 25 PIN 13
ANA2 ANA1 ANA0 FAULTA0 VSS VDD VSSA VDDA RESET
TCS
TCK
IREQA
TMS
VDD
TDI
VCAPC2
EXTAL
Figure 33. Top View, 56F801 48-pin LQFP Package
36
TRST
VSS
XTAL
TDO
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56F801 Technical Data
Freescale Semiconductor, Inc.
Package and Pin-Out Information 56F801
Table 30. 56F801 Pin Identification by Pin Number
Pin No. 1 2 3 4 5 Signal Name TD0 TD1 TD2 SS MISO MOSI SCLK TXD0 VSS VDD RXD0 DE Pin No. 13 14 15 16 17 18 19 20 21 22 23 24 Signal Name TCS TCK TMS IREQA TDI VCAPC2 VSS VDD EXTAL XTAL TDO TRST Pin No. 25 26 27 28 29 30 31 32 33 34 35 36 Signal Name RESET VDDA VSSA VDD VSS FAULTA0 ANA0 ANA1 ANA2 VREF ANA3 ANA4 Pin No. 37 38 39 40 41 42 43 44 45 46 47 48 Signal Name ANA5 ANA6 ANA7 PWMA0 VCAPC1 VDD VSS PWMA1 PWMA2 PWMA3 PWMA4 PWMA5
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6 7 8 9 10 11 12
56F801 Technical Data
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Freescale Semiconductor, Inc.
4X
0.200 AB T-U Z 9 A1
48 37
A
DETAIL Y
P
1
36
T B
U V
Freescale Semiconductor, Inc...
B1
12 25
AE V1
AE
13
24
NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DATUM PLANE AB IS LOCATED AT BOTTOM OF LEAD AND IS COINCIDENT WITH THE LEAD WHERE THE LEAD EXITS THE PLASTIC BODY AT THE BOTTOM OF THE PARTING LINE. 4. DATUMS T, U, AND Z TO BE DETERMINED AT DATUM PLANE AB. 5. DIMENSIONS S AND V TO BE DETERMINED AT SEATING PLANE AC. 6. DIMENSIONS A AND B DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE PROTRUSION IS 0.250 PER SIDE. DIMENSIONS A AND B DO INCLUDE MOLD MISMATCH AND ARE DETERMINED AT DATUM PLANE AB. 7. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. DAMBAR PROTRUSION SHALL NOT CAUSE THE D DIMENSION TO EXCEED 0.350. 8. MINIMUM SOLDER PLATE THICKNESS SHALL BE 0.0076. 9. EXACT SHAPE OF EACH CORNER IS OPTIONAL. MILLIMETERS MIN MAX 7.000 BSC 3.500 BSC 7.000 BSC 3.500 BSC 1.400 1.600 0.170 0.270 1.350 1.450 0.170 0.230 0.500 BSC 0.050 0.150 0.090 0.200 0.500 0.700 0 7 12 REF 0.090 0.160 0.250 BSC 0.150 0.250 9.000 BSC 4.500 BSC 9.000 BSC 4.500 BSC 0.200 REF 1.000 REF GAUGE PLANE
Z S1 S
4X
T, U, Z DETAIL Y
0.200 AC T-U Z
AB
G
0.080 AC
AC
BASE METAL
AD M
TOP & BOTTOM
DIM A A1 B B1 C D E F G H J K L M N P R S S1 V V1 W AA
R 0.250
N
J C E
F D 0.080
M
AC T-U Z H W DETAIL AD AA K L
SECTION AE-AE
CASE 932-03 ISSUE F
Figure 34. 48-pin LQFP Mechanical Information
38
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56F801 Technical Data
Freescale Semiconductor, Inc.
Thermal Design Considerations
Part 5 Design Considerations
5.1 Thermal Design Considerations
An estimation of the chip junction temperature, TJ, in C can be obtained from the equation:
Equation 1: Where:
TJ = T A + ( P D x R JA )
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TA = ambient temperature C RJA = package junction-to-ambient thermal resistance C/W PD = power dissipation in package Historically, thermal resistance has been expressed as the sum of a junction-to-case thermal resistance and a case-to-ambient thermal resistance:
Equation 2: Where:
RJA = RJC + R CA
RJA = package junction-to-ambient thermal resistance C/W RJC = package junction-to-case thermal resistance C/W RCA = package case-to-ambient thermal resistance C/W RJC is device-related and cannot be influenced by the user. The user controls the thermal environment to change the case-to-ambient thermal resistance, RCA. For example, the user can change the air flow around the device, add a heat sink, change the mounting arrangement on the Printed Circuit Board (PCB), or otherwise change the thermal dissipation capability of the area surrounding the device on the PCB. This model is most useful for ceramic packages with heat sinks; some 90% of the heat flow is dissipated through the case to the heat sink and out to the ambient environment. For ceramic packages, in situations where the heat flow is split between a path to the case and an alternate path through the PCB, analysis of the device thermal performance may need the additional modeling capability of a system level thermal simulation tool. The thermal performance of plastic packages is more dependent on the temperature of the PCB to which the package is mounted. Again, if the estimations obtained from RJA do not satisfactorily answer whether the thermal performance is adequate, a system level model may be appropriate. Definitions: A complicating factor is the existence of three common definitions for determining the junction-to-case thermal resistance in plastic packages: * Measure the thermal resistance from the junction to the outside surface of the package (case) closest to the chip mounting area when that surface has a proper heat sink. This is done to minimize temperature variation across the surface. Measure the thermal resistance from the junction to where the leads are attached to the case. This definition is approximately equal to a junction to board thermal resistance. Use the value obtained by the equation (TJ - TT)/PD where TT is the temperature of the package case determined by a thermocouple.
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* *
56F801 Technical Data
Freescale Semiconductor, Inc.
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple junction and over about 1mm of wire extending from the junction. The thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling effects of the thermocouple wire. When heat sink is used, the junction temperature is determined from a thermocouple inserted at the interface between the case of the package and the interface material. A clearance slot or hole is normally required in the heat sink. Minimizing the size of the clearance is important to minimize the change in thermal performance caused by removing part of the thermal interface to the heat sink. Because of the experimental difficulties with this technique, many engineers measure the heat sink temperature and then back-calculate the case temperature using a separate measurement of the thermal resistance of the interface. From this case temperature, the junction temperature is determined from the junction-to-case thermal resistance.
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5.2 Electrical Design Considerations
CAUTION
This device contains protective circuitry to guard against damage due to high static voltage or electrical fields. However, normal precautions are advised to avoid application of any voltages higher than maximum rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate voltage level. Use the following list of considerations to assure correct operation: * * Provide a low-impedance path from the board power supply to each VDD pin on the hybrid controller, and from the board ground to each VSS (GND) pin. The minimum bypass requirement is to place 0.1 F capacitors positioned as close as possible to the package supply pins. The recommended bypass configuration is to place one bypass capacitor on each of the ten VDD/VSS pairs, including VDDA/VSSA. Ceramic and tantalum capacitors tend to provide better performance tolerances. Ensure that capacitor leads and associated printed circuit traces that connect to the chip VDD and VSS (GND) pins are less than 0.5 inch per capacitor lead. Bypass the VDD and VSS layers of the PCB with approximately 100 F, preferably with a highgrade capacitor such as a tantalum capacitor. Because the controller's output signals have fast rise and fall times, PCB trace lengths should be minimal. Consider all device loads as well as parasitic capacitance due to PCB traces when calculating capacitance. This is especially critical in systems with higher capacitive loads that could create higher transient currents in the VDD and GND circuits. Take special care to minimize noise levels on the VREF, VDDA and VSSA pins.
* * * *
*
40
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56F801 Technical Data
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Electrical Design Considerations
*
Designs that utilize the TRST pin for JTAG port or OnCE module functionality (such as development or debugging systems) should allow a means to assert TRST whenever RESET is asserted, as well as a means to assert TRST independently of RESET. TRST must be asserted at power up for proper operation. Designs that do not require debugging functionality, such as consumer products, TRST should be tied low. Because the Flash memory is programmed through the JTAG/OnCE port, designers should provide an interface to this port to allow in-circuit Flash programming.
*
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56F801 Technical Data
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Freescale Semiconductor, Inc.
Part 6 Ordering Information
Table 31 lists the pertinent information needed to place an order. Consult a Motorola Semiconductor sales office or authorized distributor to determine availability and to order parts.
Table 31. DSP56F801 Ordering Information
Part 56F801 Supply Voltage 3.0-3.6 V Package Type Low Profile Plastic Quad Flat Pack (LQFP) Low Profile Plastic Quad Flat Pack (LQFP) Pin Count 48 Frequency (MHz) 80 Order Number DSP56F801FA80
56F801
3.0-3.6 V
48
60
DSP56F801FA60
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56F801 Technical Data
Freescale Semiconductor, Inc.
Electrical Design Considerations
Freescale Semiconductor, Inc...
56F801 Technical Data
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Freescale Semiconductor, Inc.
HOW TO REACH US:
USA/EUROPE/LOCATIONS NOT LISTED: Motorola Literature Distribution P.O. Box 5405, Denver, Colorado 80217 1-800-521-6274 or 480-768-2130 JAPAN: Motorola Japan Ltd. SPS, Technical Information Center 3-20-1, Minami-Azabu Minato-ku Tokyo 106-8573, Japan 81-3-3440-3569 ASIA/PACIFIC: Motorola Semiconductors H.K. Ltd. Silicon Harbour Centre 2 Dai King Street Tai Po Industrial Estate Tai Po, N.T. Hong Kong 852-26668334 HOME PAGE: http://motorola.com/semiconductors
Information in this document is provided solely to enable system and software implementers to use Motorola products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. "Typical" parameters which may be provided in Motorola data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. Motorola does not convey any license under its patent rights nor the rights of others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury or death may occur. Should Buyer purchase or use Motorola products for any such unintended or unauthorized application, Buyer shall indemnify and hold Motorola and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part.
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Motorola and the Stylized M Logo are registered in the U.S. Patent and Trademark Office. digital dna is a trademark of Motorola, Inc. All other product or service names are the property of their respective owners. Motorola, Inc. is an Equal Opportunity/Affirmative Action Employer. (c) Motorola, Inc. 2004
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DSP56F801/D


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